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Chemical Analysis
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JFP Technical Services, Inc. offers the following chemical analysis testing services to determine or verify that the materials used in your product meet your needs by: determining the material identity of unknowns, verifying that the materials meet quality requirements, identify possible types of contamination, to identify residues, fibers, and debris, sort mixed materials, and many other material tests to meet your needs. Though JFP Technical cannot perform all types of tests, we are continually adding new test methods to our services, based on your needs.

XRF Chemical Analysis:

XRF chemical analysis is fast test method that is usually a non-destructive test method that can be used in many chemical and elemental analysis applications for many types of materials. XRF chemical analysis is also a portable analysis method that can be brought to your plant or field location to test large or stationary items. JFP Technical uses one of the latest and most capable portable Niton XRF chemical analysis gun units available.

XRF analysis requires that the material or a sample of the material be placed in front of the X-ray beam that is emitted from the unit. This X-ray beam excites the atoms in the material, which causes them to emit electrons back to the detectors in the XRF unit, with each element in the material excited to a different frequency, which is sorted out and identified as a specific element by the detectors. The number of electrons detected for each element counted and is used to compute the composition of the material, which is then compared to known standard compositions for different materials and can be used to identify the material.

FT-IR Chemical Analysis:

JFP Technical also offers FT-IR analysis. Fourier Transformed – Infra Red (FT-IR) analysis is used to identify unknown plastics, rubber and other organic solids and liquids. This test method is also used to determine the quality or consistency in the composition of a sample. The FT-IR spectrum obtained from this test represents an individual fingerprint of the sample with absorption peaks at specific frequencies, which can be used to compare against known standard spectrum in our library of spectra to identify or quantify the sample.

This is a fast test that can be non-destructive if needed, requiring only a small amount of sample to be taken from the materials to be tested. Our Bruker Alpha Platinum FT-IR unit is portable, and can be brought to your plant or test site for large volume testing projects.

JFP Technical also provides many other chemical analysis methods to provide the testing you need for your product or project. Call for more information on the testing you may need.

Chemical Analysis Methods:

Metals & Ceramics Materials Analysis:

XRF Chemical Analysis of Metals to Identify and Verify
XRF Chemical Analysis of Ceramics
XRF Analysis for Sorting of Mixed Metals
XRF Analysis of Metals for Identification of Unknown Metals
XRF Analysis of Metals for Material Verification to Standards
XRF Analysis for Positive Material Identification (PMI)
XRF Analysis for Material of Construction (MOC) Identification and Verification
XRF Analysis for Biopharmaceutical Engineering (BPE) Verification
XRF Analysis of Precious Metals: Gold, Silver, Platinum, Palladium, Rhodium, etc.…
XRF Gold and Silver Content Verification for Jewelry Appraisals
XRF Analysis of Lead and Cadmium in Jewelry
XRF Analysis and Identification of Electronic Metals and MaterialsXRF Analysis and Identification of Metal Plating and Coatings: Chromium, etc….
XRF Analysis for RoHS Compliance Screening Analysis for all Products
XRF Analysis for Lead Testing
XRF Analysis for Lead-Free Solders
XRF Analysis for Presence of Minimum Level of Lead in Solders –Tin Whiskers
Chemical Analysis of Metals by OES
Chemical Analysis of Metals and Ceramics by SEM-EDS
Chemical Analysis of Metals and Ceramics by ICP
Scrap Metal Analysis for Identification and Value Assessment for Recycling
Flow Accelerated Corrosion (FAC) Testing and Analysis
Chromium Depletion on Exposed Surfaces Jet Engine Components
Spark Testing
Spot Testing

Plastic & Rubber Materials Analysis:

FT-IR Analysis for Material Identification of solids and liquids
FT-IR Analysis for Material Verification of solids and liquids
FT-IR Analysis for Quality Control Testing to an Acceptance Standard
FT-IR Analysis and Spectrum Search to Library of Stored Spectra to Identify Unknowns
FT-IR Analysis for residue, fiber, and debris identification
XRF Analysis for RoHS Compliance Screening Analysis
XRF Analysis for Halogen Content of Chlorine and Bromine
XRF Analysis for Metal Contamination
XRF Analysis to Sort PVC-type Plastics from Non-PVC Plastics

Special Chemical Analysis Testing:

Millipore Cleanliness Testing
XRF Analysis of Cleanliness Test Filters for Debris Identification
Microscope Analysis of Cleanliness Test Filters for Debris Identification
TCLP (EPA) Testing of Waste Materials for Landfill Disposal
XRF Analysis of Waste Materials for Hazardous Metals
XRF Analysis of Dust Samples and Filtered Samples
Anodize Color Fastness Testing
XRF Analysis of Toys to Determine Hazardous Metals and other Elements
Consumer Product Screening Testing for RoHS Compliance
Consumer Product Testing for Hazardous Element Content in: Clothing, Jewelry, Furniture, Toys
Consumer Product Testing for Hazardous Element Content in: Flatware, Dishes, Pans, Glassware, Cookware
XRF Analysis for the Presence of Bromine Flame Retardants
XRF Analysis for Home Paint Testing for Lead-inside and outside
XRF Analysis for Dry Wall Testing
Soil and Sediment Testing for Hazardous Metals Contamination
Soil Testing for Precious Metal Content
Soil Testing for Mineral Content
Soil Testing for Lead Contamination
Mining, Oilfield, and Exploration Soil Sample Testing
Art and Archaometry Analysis for the Provenance and Restoration of Art and Artifacts
XRF Analysis of Antiques and Collectables for Lead, Cadmium and other Hazardous Elements
XRF Analysis for Mercury contamination
XRF Analysis Surveys for Hazardous Metals in Schools, Factories, Worksites, Homes, Stores, etc.
AND MUCH MORE!!